Figure 4.

(a, b) One dimensional (1D) GIWAXD profiles of the as-cast l/c-PNDG films (48 nm in thickness) along (a) q_z and (b) q_xy directions measured at T = 25 °C before annealing. (c) 1D GIWAXD profiles of the l/c-PNDG films measured at T = 200 °C during annealing, which were obtained by azimuthally integrating of the corresponding 2D images (Figure 3b,e) from 0 to 90° azimuthal angle with respect to the q_xy-axis. The corresponding 1D GIWAXD along the q_z direction is shown in the inset. (d, e) 1D GIWAXD profiles of the annealed l/c-PNDG thin films along the (d) q_z and (e) q_xy directions after being cooled to T = 25 °C. Note that c-PNDG and l-PNDG are shown in red and blue dots, respectively.