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. 2020 Sep 23;11:4801. doi: 10.1038/s41467-020-18563-w

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© The Author(s) 2020, corrected publication 2021

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Fig. 6 — a Scanning electron microscopy image (secondary electron detector). The bright spots are the exsolved particles with an average diameter of 54 nm (standard deviation 16 nm). b Transmission electron microscopy bright field image of the film cross section. The marbled appearance of the columnar film is due to diffraction contrast. Exsolved particles are marked by arrows, the particle in the box is magnified in (c), which shows a high resolution image of this region. The slightly blurred looking halo-like fringe around the particle is due to magnetic interaction of the particle with the electron beam.