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. 2018 Aug 21;20(9):624. doi: 10.3390/e20090624

Figure 5.

Figure 5

Energy dispersive X-ray spectroscopy of (Al0.5CrFeNiTi0.25)Nx high-entropy thin films deposited at RN2 = 50%: (a) face-scanning; (b) line-scanning; the insert picture is the composite surface scanning of this region; and (c) point-scanning.