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. 2020 Sep 29;10:16017. doi: 10.1038/s41598-020-72457-x

Figure 4.

Figure 4

Step by step study of PSi surface modifications by (A) FTIR analysis (inset: comparison between different oxidation conditions on Si–O–Si bonds), (B) CA measurement, and (C) RIFTS method (inset: corresponding FFT values).