Table 3. Crystallographic Properties of Films.
| film | 2θ (degree)a | a (nm)b | I (cps)c | FWHD (degree)d | t (μm)e |
|---|---|---|---|---|---|
| film 1 | 7.96 | 1.11 | 1.05 × 103 | 0.85 | 1.7 |
| Film 1-LH | 8.88 | 1.00 | 8.16 × 102 | 0.98 | 1.6 |
| Film 1-LP | 8.91 | 0.99 | 8.16 × 102 | 0.98 | 1.6 |
| Film 1-TA | 9.83 | 0.90 | 4.36 × 102 | 1.09 | 1.5 |
a
Peak position corresponding to the lamellar interlayer spacing.
b
The value of the lamellar interlayer spacing.
c
Diffracted X-ray intensity for the peak corresponding to the lamellar interlayer spacing.
d
The full width at half-depth of the peak corresponding to the lamellar interlayer spacing.
e
Thickness of films for the XRD measurements. Film 1 was prepared by applying 0.30 wt % coating solution (0.60 mL) to a glass plate (25 × 15 × 1.1 mm) and then placing the sample in a desiccator with silica gel for 17 h. Note that the film thickness was reduced by the annealing treatments as was also observed in Figure 5a.