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. 2020 Sep 24;5(39):25125–25134. doi: 10.1021/acsomega.0c02754

Table 2. Partial Element Concentrations of the CuxO Films Annealed at 250, 300, and 350 °C Obtained from EDX Spectra.

  Cu (%)
 O (%)
  
annealing temperature (°C) atomic % weight % error (%) atomic % weight % error (%) [Cu]/[O]
250 71.43 90.78 5.3 28.57 9.22 8.3 2.50
300 55.56 83.11 5.5 44.44 16.89 8.2 1.25
350 46.51 77.39 5.4 53.49 22.61 8.0 0.87