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. 2020 Oct 5;6(10):e05088. doi: 10.1016/j.heliyon.2020.e05088

Figure 2.

Figure 2

Measuring cell stiffness using Atomic Force Microscope (A) Bright-field image of AFM scanning on a cell, (B) its corresponding topography, (C) Typical force-displacement curve during indentation, (D) Surface profile obtained from scan profile used to determine highest point of the cell, (E) Schematic representation of AFM experiment.