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. 2020 Oct 21;6(43):eabb7508. doi: 10.1126/sciadv.abb7508

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Copyright © 2020 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC).

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Fig. 6 — (A) Illustration of the scattering sample (l_s ~ 264 μm) with a curved surface and CM² raw measurement. Photo credit: Yujia Xue, Boston University. (B) The depth-coded MIPs of the CM² reconstruction recovers particles in the superficial layer of the curved surface. (C) The comparison between the CM² reconstruction and the wide-field fluorescence measurements (10×, 0.25 NA and 20×, 0.4 NA) verifies that the CM² correctly reconstructs the emitters in the superficial layer.