AWJ	Abrasive water jet
BEI	Backscattered electron imaging
BSED	Solid-state secondary electron detector
CAD	Computer-aided design
ESEM	Environmental scanning electron microscope
GSED	Gaseous secondary electron detector
IS	Inner surface of cutting kerf
LFD	Low-vacuum secondary electron detector
OS	Outer surface of cutting kerf
RMS	Root mean square
SED	Secondary electron detector
SEI	Secondary electron image
SEM	Scanning electron microscope
df	Focusing tube diameter, mm
do	Water jet orifice diameter, mm
g	Material thickness, mm
$\overline{h_v}$ (x)	Average waviness profile, μm
l	Standoff distance, mm
ma	Abrasive feed rate, kg/min
n	Jet lag distance, mm
p	Water jet pressure, MPa
pmax	Nominal pressure, MPa
r	Machining radius, mm
v	Traverse speed, mm/min
Qmax	Maximum water flow rate, dm3/min
Ra	Arithmetical mean deviation of the roughness profile, μm
Rq	Root-mean-square deviation of the roughness profile, μm
Rt	Total height of the profile on the evaluation length, μm
Sa	Arithmetic mean deviation of the surface, μm
Sal	Fastest decay autocorrelation length, mm
Sds	Density of summits of the surface, pks/mm2
SPc	Arithmetic mean peak curvature, pks/mm2
Sq	Root-mean-square deviation of the surface, μm
St	Total height of the surface, μm
Ua	Accelerating voltage, kV
WSm	Mean width of profile elements, within a sampling length, mm
Wt	Maximum height of waviness profile, μm