Fig. 4.

Custom hardware technology to enable FIB-based preparation and specimen-protected transfer of environmentally sensitive materials between a FIB/SEM and the LEAP at the Pacific Northwest National Laboratory (PNNL; WA, USA). (a) CAD-rendered image of the environmental transfer hub (ETH) main parts as (1) main vacuum chamber hub, (2), docking port for specimen transfer shuttle, (3) high-temperature ambient pressure reactor chamber, and (4) manipulator to transfer specimens between the ETH and the LEAP. (b) Photograph of the ETH system connected to the atom probe at PNNL. (c) Puck carousel with a modified APT puck slot made from thermally insulating material. (d—e) Modified environmental shuttle suitcase and FIB/SEM cold stage, respectively. Modifications were made to handle the transfer and manipulation of (f) the specific pucks used for APT analysis. Panels (a—b) and (d—e) are reproduced with permission from Perea et al. [96]. Panels (c) and (f) are reproduced with permission from Schreiber et al. [97]. PEEK, Poly-etheretherketone; CAD, computer aided design.