FIG. 1.
(a) AFM image of the MoTe2 flake on a Si/SiO2 substrate. The black circle on the flake marks the location where Raman spectra were acquired. (b) Height profile of the MoTe2 flake extracted from (a) along the white line. The flake is over 100 nm thick, which corresponds to the bulk regime. (c) Raman spectra of Td-MoTe2 acquired at 5 K. The four peaks examined in this study are labeled along with the symmetry assignments.