Figure 23.
Microstructure of Al-12Si samples prepared by SLM with angle of inclination γ = 90° (i.e., perpendicular to the substrate plate): (a,b) OM and (c,d) SEM micrographs, and (e,f) EDX composition maps for Al (red) and Si (green), respectively [67]. Copyright 2013. Adapted with permission from Elsevier Science Ltd. under the license number 4803720747532 (Figure 1 [67]), dated 7 April 2020.