Figure 29.
(a) XRD patterns (λ = 0.17889 nm) of the Al-12Si SLM specimens (γ = 90°) isothermally annealed for 6 h at temperatures between 473 and 723 K; (b) crystallite sizes of Al and Si, and (c) lattice parameters of Al and the amount of free Si versus the annealing temperature [67]. Copyright 2013. Adapted with permission from Elsevier Science Ltd. under the license number 4803720747532 (Figure 5 [67]), dated 7 April 2020.