Skip to main content
. 2020 Sep 6;7(21):2001655. doi: 10.1002/advs.202001655

Figure 5.

Figure 5

a) Schematic of tip sonicator. The solution tube is sealed with Teflon tape and parafilm to minimize exposure to ambient atmosphere. b) Exfoliated GeS NSs in various solvents (centrifuged at 1000 rpm for 10 min), and c) concentration of exfoliated bulk powder of GeS as a function of solvent surface tension. The NMP‐exfoliated GeS is considered as a reference concentration. d) Raman spectra of a bulk GeS crystal and solution‐processed GeS flakes. e) AFM topography image of NSs. f) TEM image of NSs. g) Thickness (inset: as‐prepared GeS dispersion) and h) lateral size histograms (from statistical TEM analysis) of the as‐exfoliated GeS NSs. i) Thickness (inset: centrifuged GeS dispersion at 500 rpm) and j) lateral size histograms (from statistical TEM analysis) of the centrifuged GeS NSs. Reproduced with permission.[ 140 ] Copyright 2018, American Chemical Society. h) AFM images, corresponding height profiles, and thickness distribution histograms of LPE GeS NSs collected with different centrifugation speeds. Reproduced with permission.[ 143 ] Copyright 2019, American Chemical Society.