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. 2020 Sep 6;7(21):2001655. doi: 10.1002/advs.202001655

Table 6.

Summary of dielectric constant of different materials with structural in‐plane anisotropy obtained from theoretical calculations[ 31 , 214 , 216 , 218 ]

Materials Layer number/thickness Dielectric constant (ε) EQE [%] References
Si 2 nm thick 11.9 [ 215 , 216 ]
MoS2 Monolayer 7 [ 214 , 216 ]
BP 7.47 (armchair) 3.06 (zigzag) [ 218 ]
GeS 8.7 (armchair) 8.6 (zigzag) 10.27 [ 31 , 41 ]
GeSe 13.8 (armchair) 14.7 (zigzag) 25.43 [ 31 , 41 ]
SnS 9.9 (armchair) 10.0 (zigzag) 22.01 [ 31 , 41 ]
SnSe 12.5 (armchair) 12.8 (zigzag) 30.32 [ 31 , 41 ]