Extended Data Fig. 7. Maps of the average von Mises stress near half-integer topological defects.
(a, a’) Experiments: (a) -1/2 defects (n = 2810); (a’) +1/2 defects (n = 2924), from N = 2 independent experiments. (b, b’) Simulations: (b) -1/2 defects (n = 8555); (b’) +1/2 defects (n = 8553, N = 2 independent simulations, soft gel case set of parameters, see Table 1 SI). White dots represent centre of the defects and black dots the sites of hole formation.