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. 2023 Jun 15;17(12):11583–11592. doi: 10.1021/acsnano.3c01698

Figure 5.

Figure 5

In situ XRD characterization and analysis of the [AMIM][TFSI]-based device. (a) XRD results of charging the device (intercalated with [TFSI]) from 0 to 3.6 V, followed by discharging at up to −2 V. (b) Peak analysis refers to the stage of intercalation achieved at a varied voltage level. The inset shows the schematic of the stage 3 intercalated graphene layers. (c) Theoretical higher-order peak positions of [TFSI] intercalation at varied intercalation stages.