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. 2020 Oct 30;76(Pt 11):1779–1793. doi: 10.1107/S2056989020014097
  (I) (II) (III) (IV) (V)
Crystal data
Chemical formula C11H17N2O+·C7H4ClO2 C11H17N2O+·C7H4BrO2 C11H17N2O+·C7H4IO2 C11H17N2O+·C7H4FO2 C11H17N2O+·C7H4ClO2
M r 348.82 393.27 440.27 332.37 348.82
Crystal system, space group Triclinic, P Inline graphic Triclinic, P Inline graphic Triclinic, P Inline graphic Monoclinic, C c Monoclinic, P21/c
Temperature (K) 296 296 296 296 296
a, b, c (Å) 7.401 (1), 7.888 (1), 15.410 (3) 7.4313 (5), 7.9163 (5), 15.5212 (9) 7.1129 (4), 11.2722 (7), 12.5923 (8) 19.940 (1), 10.2705 (7), 9.0148 (7) 7.9974 (8), 27.611 (2), 8.5972 (9)
α, β, γ (°) 100.28 (2), 94.40 (1), 94.14 (1) 101.565 (5), 94.780 (5), 92.691 (5) 69.852 (5), 74.681 (5), 79.121 (5) 90, 109.663 (8), 90 90, 106.40 (1), 90
V3) 879.2 (2) 889.54 (10) 908.82 (10) 1738.5 (2) 1821.2 (3)
Z 2 2 2 4 4
Radiation type Mo Kα Mo Kα Mo Kα Mo Kα Mo Kα
μ (mm−1) 0.24 2.33 1.78 0.09 0.23
Crystal size (mm) 0.44 × 0.28 × 0.16 0.42 × 0.42 × 0.12 0.48 × 0.24 × 0.14 0.48 × 0.36 × 0.22 0.48 × 0.20 × 0.12
 
Data collection
Diffractometer Oxford Diffraction Xcalibur with Sapphire CCD Oxford Diffraction Xcalibur with Sapphire CCD Oxford Diffraction Xcalibur with Sapphire CCD Oxford Diffraction Xcalibur with Sapphire CCD Oxford Diffraction Xcalibur with Sapphire CCD
Absorption correction Multi-scan (CrysAlis RED; Oxford Diffraction, 2009) Multi-scan (CrysAlis RED; Oxford Diffraction, 2009) Multi-scan (CrysAlis RED; Oxford Diffraction, 2009) Multi-scan (CrysAlis RED; Oxford Diffraction, 2009) Multi-scan (CrysAlis RED; Oxford Diffraction, 2009)
T min, T max 0.884, 0.963 0.258, 0.756 0.534, 0.779 0.884, 0.963 0.747, 0.973
No. of measured, independent and observed [I > 2σ(I)] reflections 6241, 3763, 2318 5996, 3739, 2989 6342, 3897, 3203 6204, 3343, 2786 13275, 3410, 2060
R int 0.019 0.018 0.012 0.012 0.030
(sin θ/λ)max−1) 0.650 0.652 0.660 0.658 0.607
 
Refinement
R[F 2 > 2σ(F 2)], wR(F 2), S 0.053, 0.131, 1.01 0.043, 0.115, 1.05 0.026, 0.065, 1.02 0.036, 0.100, 1.03 0.067, 0.216, 1.03
No. of reflections 3763 3739 3897 3343 3410
No. of parameters 224 224 224 256 223
No. of restraints 0 0 0 25 0
H-atom treatment H atoms treated by a mixture of independent and constrained refinement H atoms treated by a mixture of independent and constrained refinement H atoms treated by a mixture of independent and constrained refinement H atoms treated by a mixture of independent and constrained refinement H atoms treated by a mixture of independent and constrained refinement
Δρmax, Δρmin (e Å−3) 0.19, −0.27 0.84, −0.55 0.52, −0.70 0.24, −0.14 1.15, −0.30
Absolute structure Flack x determined using 1089 quotients [(I +)−(I )]/[(I +)+(I )] (Parsons et al., 2013)
Absolute structure parameter 0.2 (3)