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. 2020 Oct 6;76(Pt 11):1701–1707. doi: 10.1107/S2056989020013134

Table 5. Experimental details.

  (I) (II) (III) (IV)
Crystal data
Chemical formula C7H3.65ClNO4·C10H9.35N C7H4ClNO4·C10H9N C7H3.59ClNO4·C10H9.41N C7H3.48ClNO4·C10H9.52N
M r 344.74 344.74 344.75 344.75
Crystal system, space group Monoclinic, P21/c Triclinic, P Inline graphic Orthorhombic, P212121 Monoclinic, C c
Temperature (K) 185 186 190 185
a, b, c (Å) 9.5055 (2), 8.3019 (4), 19.5865 (4) 6.8693 (3), 7.6482 (4), 15.1195 (4) 7.1156 (4), 7.5854 (4), 28.8599 (14) 7.4271 (6), 14.4348 (6), 16.2208 (7)
α, β, γ (°) 90, 95.7214 (7), 90 78.218 (3), 81.1923 (18), 77.754 (3) 90, 90, 90 90, 113.203 (3), 90
V3) 1537.94 (8) 754.89 (6) 1557.70 (14) 1598.35 (16)
Z 4 2 4 4
Radiation type Mo Kα Mo Kα Mo Kα Mo Kα
μ (mm−1) 0.27 0.28 0.27 0.26
Crystal size (mm) 0.40 × 0.35 × 0.35 0.45 × 0.35 × 0.30 0.30 × 0.30 × 0.17 0.28 × 0.25 × 0.20
 
Data collection
Diffractometer Rigaku R-AXIS RAPIDII Rigaku R-AXIS RAPIDII Rigaku R-AXIS RAPIDII Rigaku R-AXIS RAPIDII
Absorption correction Numerical (NUMABS; Higashi, 1999) Numerical (NUMABS; Higashi, 1999) Numerical (NUMABS; Higashi, 1999) Numerical (NUMABS; Higashi, 1999)
T min, T max 0.887, 0.909 0.891, 0.920 0.938, 0.955 0.931, 0.949
No. of measured, independent and observed [I > 2σ(I)] reflections 30539, 4487, 4065 15404, 4381, 3868 30061, 4532, 4365 16695, 4645, 4158
R int 0.025 0.023 0.017 0.015
(sin θ/λ)max−1) 0.704 0.703 0.703 0.703
 
Refinement
R[F 2 > 2σ(F 2)], wR(F 2), S 0.034, 0.096, 1.06 0.036, 0.108, 1.05 0.028, 0.079, 1.06 0.030, 0.081, 1.09
No. of reflections 4487 4381 4532 4645
No. of parameters 225 222 225 225
No. of restraints 2 0 2 4
H-atom treatment H atoms treated by a mixture of independent and constrained refinement H atoms treated by a mixture of independent and constrained refinement H atoms treated by a mixture of independent and constrained refinement H atoms treated by a mixture of independent and constrained refinement
Δρmax, Δρmin (e Å−3) 0.43, −0.22 0.48, −0.26 0.31, −0.26 0.35, −0.16
Absolute structure Flack x determined using 1821 quotients [(I +)−(I )]/[(I +)+(I )] (Parsons et al., 2013) Flack x determined using 1899 quotients [(I +)−(I )]/[(I +)+(I )] (Parsons et al., 2013)
Absolute structure parameter −0.014 (8) −0.023 (9)

Computer programs: PROCESS-AUTO (Rigaku, 2006), SHELXT (Sheldrick, 2015a ), SHELXS97 (Sheldrick, 2008), SHELXL (Sheldrick, 2015b ), ORTEP-3 for Windows (Farrugia, 2012) and Mercury (Macrae et al., 2020), CrystalStructure (Rigaku, 2018) and PLATON (Spek, 2020).