Fig. 2.

Synchrotron and XFEL data collection setups. (a) Schematics of the SWSX data collection process. The bar colour indicates the DOZOR score (from red – the best diffraction, to yellow – the worst). For minisets collected from the same crystal, as judged by the diffraction patterns and DOZOR score heatmap, an overlap of δω = 1–2° is introduced between consecutive sets. When the rotation angle ω exceeds ~10° from the initial orientation, as for the point 1d, an additional line scan is performed to re-align the crystal. The orientations of two different crystals 1 and 2 in the loop are assumed independent, and thus minisets from them are collected within the same ω range. (b) LCP-SFX data collection scheme. Microcrystals embedded in LCP are injected inside a vacuum chamber into the XFEL beam focus region using a viscous media microextrusion injector. A stream of sheath gas (nitrogen or helium) is used to keep the LCP stream straight. Microcrystals intersect with the XFEL beam in random orientations and diffraction patterns are collected by a CSPAD detector.