Table 1. Elemental Surface Concentrations and Relative Abundance of Carbon Bonds for the Plasma-Modified TEMPO-CNF Films Analyzed Using XPS^a.

	elemental concentrations [atom %]						relative abundance of carbon bonds [atom %]
sample	C 1s	O 1s	N 1s	Si 2p	O/Si	C/Si	C–C/C–Si	C–O	O–C–O	O–C=O
ref TEMPO-CNF	54.5	41.1	0.5	2.6			11.9	67.8	17.1	3.2
HMDSO	44.9	36.2	0.4	18.4	2.0	2.4	45.4	43.3	10.0	1.2
APTES	53.2	27.3	5.5	14.0	2.0	3.8	52.4	37.9	9.2	0.5
APTES + HMDSO	35.8	35.7	3.5	24.9	1.4	1.4	65.9	21.0	6.7	6.4

^aValues are given in atomic percentage as an average of at least two measurements.