Table 1.

Summary of Pt Particle Characterization (Based on SEM images), Electrode Performance (Based on Figure 2), and Degradation Behavior (Based on Figure 3 and S6–8)^a

	approximate Pt loadinga (μg cm−2)	SiOx thickness (nm)	average Pt nanoparticle diameter (nm)	Pt 2D coverage (%)	V vs RHE (mV) at −10 mA cm−2	ΔV (mV) between LSV 1 and 3 at −10 mA cm−2	ΔV/h (mV/h) during CP	ΔV (mV) between LSV before and after 1 h CP at −10 mA cm−2
MIS	1	0	38 ± 32	3.3 ± 0.8	−280	−200	−140	n/ab
MIS	5	0	55 ± 36	15 ± 3.1	+7	−70	−80	−260
MIS	20	0	66 ± 54	42 ± 1.2	−60	−30	−45	−110
IMIS	1	2	37 ± 30	3.9 ± 0.6	+60	−30	−11	−80
IMIS	5	2	58 ± 34	13 ± 0.9	+70	−40	−14	−30
IMIS	20	2	70 ± 53	32 ± 1.6	+30	−10	−6	−15
IMIS	5	5	65 ± 42	13 ± 0.2	+100	−20	−7	−12
IMIS	5	10	53 ± 38	14 ± 1.1	+70	−8	−5	−5

^aSee the Supporting Information for more details on SEM analysis of Pt loading, Pt particle density, Pt surface area, Pt coverage, and average Pt particle sizes and distances.

^bLSV performance of the MIS sample with lowest loading degraded so much that the photocurrent did not reach 10 mA cm⁻².