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. 2020 Oct 1;7(22):1902989. doi: 10.1002/advs.201902989

Figure 1.

Figure 1

a) TEM image, b) HRTEM image, and c) HAADF‐STEM image of Bi@Sn NPs. d–g) HAADF‐STEM and EDX elemental mapping images of an individual Bi@Sn NP. h) Line‐scanning profiles of Sn and Bi along the yellow line in (d). i) XRD pattern of Bi@Sn NPs; the corresponding magnified XRD pattern of Bi@Sn NPs is given in the inset.