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. 2020 Nov 20;6(47):eabb3095. doi: 10.1126/sciadv.abb3095

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Copyright © 2020 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC).

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Fig. 3 — Strong coupling between the CQDs and 4-μm SiO₂/Si based on a characterization of the spectral image. (A) PL spectral image. (B) RL spectral image of 4-μm SiO₂/Si. Extracted PL spectra compared with the RL spectra for different angles: (C) 0° and (D) 8.3°. (E) Peak energies as function of collection angle. (F) Angular dispersion of the coupled exciton transition energies in the F-P cavity formed by SiO₂/Si. The horizontal dotted line at 1.893 eV is the CQD exciton transition energy in a solvent. The scattered symbols show the experimental results. The gray line shows the angular dispersion of the photon mode for the F-P cavity without CQDs. The solid line is a fit to the data using the strong coupling formula.