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. 2020 Sep 21;28(20):29590–29618. doi: 10.1364/OE.400240

Fig. 3.

Fig. 3.

Illustration of the metric for measuring the RMS average A¯ξϕ of the magnitude error at one pixel i between the complex value before convergence (An,iexp[iϕn,i]; shown in blue) and after convergence (A,iexp[iϕ,i]; shown in red). When obtaining a particular measure of the phase difference ϕn,iϕ,i from a complex value z~=Aexp[iϕ] on the real (Re) and imaginary (Im) plane, one could obtain erroneous values in the case shown where the phase before convergence is reported as πϵn,i while the phase after convergence is reported as (πϵ,i), one would obtain an erroneous phase difference ϕn,iϕ,i of near 2π. Calculating the RMS difference between complex wavefields (Eq. (24)) circumvents this problem by measuring the end-to-end distance between the red and blue vectors at individual pixels i, a result that does not require phase wrapping. When the moduli An,i and A,i are similar, the average modulus of the green vector (labeled here as A¯ξϕ using Eq. (24)) is approximately linearly related to the RMS average of A¯|ϕn,iϕ,i| subtended by the blue and red vectors.