CNWs	Carbon nanowalls
ECR	Electron cyclotron resonance
MW	Microwave
RF	Radiofrequency
IC	Inductively coupled
APPJ	Atmospheric-pressure plasma jet
CVD	Chemical vapor deposition
PECVD	Plasma-enhanced chemical vapor deposition
RDE	Rotating disk electrode
CV	Cyclic voltammetry
EIS	Electrochemical impedance spectroscopy
STM	Scanning tunneling microscopy
TEM	Transmission electron spectroscopy
XPS	X-ray photoelectron spectroscopy
AFM	Atomic force microscopy
AAFM	Acoustic atomic force microscopy
ARPES	Angle-resolved photoemission spectroscopy
NEXAFS	Near-edge X-ray absorption fine structure
SAED	Elective area electron diffraction
XRD	X-ray diffraction
SPEM	Scanning photoemission microscopy
UPS	Ultraviolet photoelectron spectroscopy
ARIPES	Angle-resolved inverse photoemission spectroscopy
LEED	Low-energy electron diffraction
WCA	Water contact angle measurements
OES	Optical emission spectroscopy
FTIR	Fourier-transform infrared spectroscopy
ORR	Oxygen reduction reaction