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. 2020 Nov 19;20(22):6611. doi: 10.3390/s20226611
NTA Nanoparticle Tracking Analysis
SEM Scanning Electron Microscopy
RMM Resonant Mass Measurement
TEM Transmission Electron Microscopy
DLS Dynamic Light Scattering
SPR Surface Plasmon Resonance
N.P. Nanoparticle
FWHM Full Width at Half Maximum
RI Refractive Index
EV Extracellular Vesicle