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. 2020 Oct 19;21(11):215–225. doi: 10.1002/acm2.13062

Fig. 2.

Fig. 2

(a) Transverse and (b) sagittal planes of the module used for uniformity analysis of a cone‐beam computed tomography acquired using the Head technique and with the presence of a central dark artifact. (c) An HU line profile across the center of the transverse plane.