Figure 1.
a) Schematic device structure, b) cross‐sectional TEM image, and c) energy band diagram in the unbiased condition of the control device. d) Normalized EL/PL spectra, e) J–V–L, and f) CE–L–EQE characteristics for the control device.
a) Schematic device structure, b) cross‐sectional TEM image, and c) energy band diagram in the unbiased condition of the control device. d) Normalized EL/PL spectra, e) J–V–L, and f) CE–L–EQE characteristics for the control device.