3D-DIC	Three-dimensional digital image correlation (3D-DIC)
AOI	Area of interest
CH	Conoscopic holography
CS	Confocal sensor
CSI	Computational shear interferometry
CLA	Chromatic light aberration phenomenon
CLSM	Confocal laser scanning microscopy
CMM	Coordinate measuring machine
CT	X-ray computed tomography
DIA	Digital image acquisition
EDS	Energy-dispersive X-ray spectrometry
EDXRF	Energy-dispersive X-ray fluorescence spectrometry
EMA	Electron microprobe analysis
FP	Fringe projection
FVM	Focus variation microscopy
GRT	Gamma-ray transmission
LAMQS	Laser ablation coupled to mass quadrupole spectrometry
LIBS	Laser-induced breakdown spectroscopy
MI	Moiré interferometry
ND	Neutron diffraction
OM	Optical microscopy
PIXE	Particle (proton)-induced X-ray emission
PS	Phase stepping
RBS	Rutherford backscattering spectrometry
XPS	X-ray photoelectron spectroscopy
XRD	X-ray diffraction
SEM	Scanning electron microscopy
SL	Structured light
SP	Speckle projection
SRXRF	Synchrotron radiation X-ray fluorescence spectrometry
TEM	Transmission electron microscopy
TPU	Temporal phase unwrapping
WD	Working distance, mm
Sa	Arithmetic mean deviation of the surface, µm
Sku	Kurtosis of the height distribution, -
Sp	Maximum height of summits, µm
Sq	Root-mean-square deviation of the surface, µm
Ssk	Skewness of the height distribution, -
St	Total height of the surface, µm
Sv	Maximum depth of valleys, µm