Fig. 4.

(A) Deformation at ${\epsilon }_{\text{applied}}^{yy}=-4\%$ of a sample with eight phase-inducing defects arranged along two lines that form an angle ${\phi }_{\text{d}}=\arctan \left(1/2\right)$ and $\pi /4$ with the horizontal axis. (B) Analytically predicted evolution of $E_{\text{total}}$ at ${\epsilon }_{\text{applied}}^{yy}=-4\%$ as a function of ${\zeta }_0$ and $\phi$. The triangle corresponds to the configuration of the experimentally observed domain wall. (C) Deformation at ${\epsilon }_{\text{applied}}^{yy}=-4\%$ of a sample with four pinning defects in addition to eight phase-inducing defects arranged as in A. (D) Analytically predicted evolution of $E_{\text{total}}$ at ${\epsilon }_{\text{applied}}^{yy}=-4\%$ as a function of domain wall position ${\zeta }_0$ and orientation $\phi$. The triangle corresponds to the configuration of the experimentally observed domain wall. (E) Numerically predicted deformation at ${\epsilon }_{\text{applied}}^{yy}=-4\%$ for $51\times 51$ structures with the pinning defects arranged along complex paths (in addition to phase-inducing defects to initiate phase+ and phase− at desired locations). The color in all snapshots corresponds to the rotation of the squares.