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. 2020 Dec 17;10:22144. doi: 10.1038/s41598-020-78973-0

Figure 2.

Figure 2

Quantitative material contrast mapping of Pt/Au foils on a Al base plate at a primary beam voltage of 1 kV (a) Conventional SE detector image/pixel intensity histogram. (b) Combination spectral image/pixel intensity histogram for k = 0.5. (c) EDX mapping at 2.5 kV.