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. 2020 Dec 9;13(24):5608. doi: 10.3390/ma13245608

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© 2020 by the authors.

Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).

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Normalized applied stress (black line) and damage evolution in terms of acoustic emissions (dotted red line); electrical resistance (dashed blue line); and crack surface advancements by indirect measurement (light green line). The diagrams refer to the specimens corresponding to the data presented in (a–e) (see inset table of Figure 3). The last picture (e’) is a detail of the positive half-plane (damage $D > 0$ ): negative values are due to temporary decrements in the electrical resistance of Luserna specimen (e).

Normalized applied stress (black line) and damage evolution in terms of acoustic emissions (dotted red line); electrical resistance (dashed blue line); and crack surface advancements by indirect measurement (light green line). The diagrams refer to the specimens corresponding to the data presented in (a–e) (see inset table of Figure 3). The last picture (e’) is a detail of the positive half-plane (damage $D > 0$ ): negative values are due to temporary decrements in the electrical resistance of Luserna specimen (e).