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. 2020 Dec 16;10(12):2531. doi: 10.3390/nano10122531

Figure 1.

Figure 1

SEM images (a,b) of laser-modified 15×(Ti/Zr)/Si multilayer thin films with a fluence of 0.662 Jcm2, and energy-dispersive X-ray spectroscopy (EDS) spectra (c) recorded from un-modified and laser-treated surface.