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. 2020 Apr 3;12:84. doi: 10.1007/s40820-020-00418-0

Fig. 4.

Fig. 4

a Steady-state PL spectra of annealed perovskite layers prepared without (control) and with LTAG treatment at 30 °C. b TRPL spectra of the control and LTAG-based perovskite films. c Nyquist plots for the control and LTAG-based perovskite devices in the dark. d Current–voltage curves and extracted defect densities of electron-only devices prepared using the control and LTAG-based methods; insets: the single-carrier device structures