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. 2020 Apr 21;12:99. doi: 10.1007/s40820-020-00427-z

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© The Author(s) 2020

Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 3 — a, b TEM and high-resolution TEM (HRTEM) images of a 2D Te flake. Inset of b shows the electron diffraction pattern. c HRTEM image of the Te flake edge. d Optical microscope (OM) image of 2D Te flakes, scale bar = 4 μm, with inset of a single flake. e AFM image of 2D Te flake, scale bar = 2 μm, with the step height profile of the flake edge. Adapted with permission from [67]. Copyright 2014, American Chemical Society. f STM image of 2D Te grown on graphene with a step height profile of the edge. g High-resolution STM of monolayer Te flake. h STM image of the reconstructed graphene (upper and inset) and single-layer Te flake (lower). i, j Fast Fourier transforms of graphene and single-layer Te flake. Adapted with permission from [68]. Copyright 2017, American Chemical Society