Table 4. Full XPS Quantification in at.% of All Studied Catalysts after Selected DRM Treatments Based on the Deconvolution Profiles of Figure S14.
La1.8Ba0.2NiO4 |
La2Ni0.8Cu0.2O4 |
La1.8Ba0.2Ni0.9Cu0.1O4 |
|||||||
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XPS fitting data (atom %) of Ni 3p region for catalysts | 3p 3/2 (Ni3+) | 3p 3/2 (Ni2+) | 3p 3/2 (Ni0) | 3p 3/2 (Ni3+) | 3p 3/2 (Ni2+) | 3p 3/2 (Ni0) | 3p 3/2 (Ni3+) | 3p 3/2 (Ni2+) | 3p 3/2 (Ni0) |
before DRM | 19.99 | 80.01 | 0 | 0 | 100 | 0 | 18.03 | 81.97 | 0 |
cooled down at 770 °C | - | - | - | 0 | 75.12 | 24.88 | 13.92 | 63.28 | 22.8 |
after keeping at 800 °C for 30 min | 10.55 | 42.18 | 47.27 | 0 | 60 | 40 | 0 | 60.45 | 39.55 |
after keeping at 800 °C for 90 min | 7.29 | 36.46 | 56.25 | 0 | 49.11 | 50.89 | 0 | 51.44 | 48.56 |