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. 2020 Dec 23;21(1):44. doi: 10.3390/s21010044
SHM Structural Health Monitoring
NDT Non-Destructive Testing
EMI Electro-Mechanical Impedance
PWAS Piezoelectric Active Wafer Sensor
RMSD Root Mean Square Deviation
MAPD Mean Absolute Percentage Deviation
CCD Correlation Coefficient Deviation
FE Finite Element
FEM Finite Element Method
IMA Impedance Analyzer
SLDV Scanning Laser Doppler Vibrometer