| PIV: | particle image velocimetry |
| CCD: | charge coupled device |
| SEM: | scanning electron microscope |
| BSE: | back-scattered electron |
| FEM | finite element method |
| PIV: | particle image velocimetry |
| CCD: | charge coupled device |
| SEM: | scanning electron microscope |
| BSE: | back-scattered electron |
| FEM | finite element method |