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. 2021 Jan 13;12:361. doi: 10.1038/s41467-020-20582-6

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© The Author(s) 2021

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 1 — a An illustration of the VAC-treatment. b Schematic of the PeLED structure and the HAADF cross-sectional device image. The scale bar is 100 nm. c Histograms of peak EQEs extracted from control (top) and VAC-treated devices (bottom) with varying chloride contents (30%, 35% and 40%). d–f Spectral stability for control and VAC-treated devices with 40% Cl loading. The representative plots of CIE_y versus applied voltages (top) and current densities (bottom) (d); EL spectra at low and high voltage/current density for control (left) and VAC-treated devices (right) (e); EL spectra of VAC-treated devices with varying chloride content (30–57%) at maximum luminance (f). The points labelled as L_max in (d) represent the operational condition for peak luminance.