Figure 2.
The relationship of CE and the change of phase shift (Δϕ) during the tapping vibration to probe the force zone within which charge transfer occurs
Adopted from (Li et al., 2016).
(A–F) The relationship of ΔV-Asp and Δϕ-Asp with A0 = 100 nm, 70 nm, and 50 nm.
(G) The schematic diagram of the tip-sample interaction force of trapping scans with different scanning parameters (A0 and Asp).
