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. 2021 Jan 20;16(1):e0245693. doi: 10.1371/journal.pone.0245693

Fig 4. Influence of labeling efficiency.

Fig 4

For each data point 500000 tetramers (side length 5 nm) were simulated, assuming Nmax = 104 photons (gray line) or Nmax = 105 (black line). (A) Percentage of eligible tetramers. (B) Relative error εl shown in a symmetric logarithmic plot. Positive and negative relative errors represent overestimation and underestimation, respectively. Error bars indicate the 95% confidence intervals.