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. 2020 Nov 5;50:25. doi: 10.1186/s42649-020-00045-4

Table 1.

Imaging methodology for interface analysisa

Technology Highest lateral resolution Highest depth resolution Scanning time
Infrared 250 μm 250 μm 3 min
X-ray tomography 10 μm >  2 μm 30 min
Scanning Acoustic Microscope < 1 μm 1 μm 2–8 min
Optical Microscope 0.3 μm 1 μm 5 min
Transmission Electron Microscope 0.1 nm 50 nm 60 min

asome data courtesy of PVA TePla Analytical System