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. 2021 Jan 22;12:551. doi: 10.1038/s41467-020-20856-z

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© The Author(s) 2021

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 1 — a D^*of two donor:C₆₀ (6 mol%) material systems assuming shot noise at −1 V and EQE as measured (solid lines), shot noise at −1 V and normalized EQE at the maximum of the spectrum (hatched region), and shot noise in the radiative limit and EQE as measured (dashed lines). Symbols show data from literature^8,15–22. b S_n of four donor:C₆₀ (6 mol%) material systems. Dashed lines represent the shot noise calculated at I_bias. See Supplementary Figs. 15 and 16 for more results. (*) Hamamatsu K1713-05.