Table 2.
Surface atomic concentrations of C, F, O, N elements determined by XPS analysis in pristine PTFE and PTFE treated by plasma at 3 and 8 W for 60, 120, and 240 s. The error of measurement did not exceed 2%.
| Sample | Elemental Concentration (at. %) | |||
|---|---|---|---|---|
| C (1 s) | F (1 s) | O (1 s) | N (1 s) | |
| Pristine PTFE | 32.13 | 67.87 | - | - |
| PTFE + plasma 3 W 60 s | 36.00 | 59.13 | 4.55 | 0.32 |
| PTFE + plasma 3 W 120 s | 37.94 | 56.79 | 4.94 | 0.33 |
| PTFE + plasma 3 W 240 s | 40.46 | 50.80 | 8.38 | 0.36 |
| PTFE + plasma 8 W 60 s | 40.01 | 51.36 | 8.31 | 0.31 |
| PTFE + plasma 8 W 120 s | 40.14 | 50.93 | 8.51 | 0.43 |
| PTFE + plasma 8 W 240 s | 40.02 | 50.93 | 8.69 | 0.36 |