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. 2020 Oct 26;27(Pt 6):1553–1563. doi: 10.1107/S1600577520012746

Table 2. Averaged specific Bragg-plane slope errors Inline graphic and averaged normalized dispersions Inline graphic of the Bragg reflection widths in the reference silicon crystal and in the best diamond crystal VB5 (after HTHV annealing) calculated with binning number 80 from data measured with the old and the new beamline Be windows.

  Old Be window New Be window
Crystal Inline graphic Inline graphic Inline graphic Inline graphic
(reflection) (µrad mm−2) (mm−2) (µrad mm−2) (mm−2)
Si(531) 0.08 (3) 0.007 (3) 0.05 (2) 0.003 (1)
C*(400) 0.12 (5) 0.013 (5) 0.08 (3) 0.006 (2)