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. 2021 Feb 3;12:767. doi: 10.1038/s41467-021-20995-x

Fig. 1. Principle of the measurement.

Fig. 1

a Simplified two-level system used to model the spin-dependent photoluminescence (PL) of the NV defect. b Normalized PL intensity of the NV defect as a function of the spin relaxation time T1 for two different regimes of optical excitation power P. The parameter Psat denotes the saturation power of the NV defect optical transition.