Figure 4.

(a) A schematic illustration showing the interdiffusion and development of diffuse interphases during the coextrusion process for a compatible multilayered A/B system. “I” stands for the interphase shown by the bright regions in the schematic layered structures. (b) Scheme explaining the bimodal interfacial Maxwell–Wagner–Sillars (MWS) relaxations measured by dielectric relaxation spectroscopy for multilayered films subjected to an alternating electric field. (c) EDX measured concentration profile of F and O (in atomic fraction) versus measured positions for an eight-layer PVDF/PMMA film. Reproduced with permission from Ref. [5]. Copyright (2018) American Chemical Society.