| Crystal data |
| Chemical formula |
[Cd(C13H11N4O2)2] |
|
M
r
|
622.91 |
| Crystal system, space group |
Orthorhombic, A
b
a2 |
| Temperature (K) |
108 |
|
a, b, c (Å) |
12.6654 (1), 17.63940 (18), 10.88800 (11) |
|
V (Å3) |
2432.49 (4) |
|
Z
|
4 |
| Radiation type |
Cu Kα |
| μ (mm−1) |
7.64 |
| Crystal size (mm) |
0.12 × 0.10 × 0.08 |
| |
| Data collection |
| Diffractometer |
Rigaku Oxford Diffraction XtaLAB Synergy R, DW system, HyPix |
| Absorption correction |
Multi-scan (CrysAlis PRO; Rigaku OD, 2020 ▸) |
|
T
min, T
max
|
0.519, 1.000 |
| No. of measured, independent and observed [I > 2σ(I)] reflections |
36223, 2475, 2458 |
|
R
int
|
0.038 |
| (sin θ/λ)max (Å−1) |
0.630 |
| |
| Refinement |
|
R[F
2 > 2σ(F
2)], wR(F
2), S
|
0.026, 0.075, 1.20 |
| No. of reflections |
2475 |
| No. of parameters |
182 |
| No. of restraints |
1 |
| H-atom treatment |
H atoms treated by a mixture of independent and constrained refinement |
| Δρmax, Δρmin (e Å−3) |
0.72, −0.99 |
| Absolute structure |
Flack x determined using 1131 quotients [(I
+)−(I
−)]/[(I
+)+(I
−)] (Parsons et al., 2013 ▸). |
| Absolute structure parameter |
−0.012 (4) |
