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. 2021 Feb 8;11:3330. doi: 10.1038/s41598-021-82821-0

Figure 2.

Figure 2

Diffraction patterns of the two identical 3-layer-systems: 100 nm HfO2/20 nm W/100 nm HfO2, measured before and after annealing at 650 °C (a) and 1520 °C (b) for 6 h.